At-Speed Distributed Functional Testing to Detect Logic and Delay Faults in NoCs

A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip

Advancing VLSI Design Reliability: A Comprehensive Examination of Embedded Deterministic Test (EDT) Logic insertion and its impact on Fault Classification and Transition Faults

PDF) Performance Evaluation of NoC for Homogeneous MPSoC with OMNeT++

At-Speed Distributed Functional Testing to Detect Logic and Delay Faults in NoCs

Delay Faults

A high fault coverage test approach for communication channels in

Transition fault detection

At-Speed Distributed Functional Testing to Detect Logic and Delay Faults in NoCs

PDF] A Scalable built-in self-test/self-diagnosis architecture for

PDF) OSDTM: an Offline-Structural Distributed Test Mechanism for